The 25th International Conference on Amorphous and Nano-crystalline Semiconductors
August 18–23, 2013 Toronto, Ontario Canada
Medical Imaging Devices
Chair: John Rowlands, Thunder Bay Regional Research Institute
Th-B4.1 (invited) 15:50–16:20
Electro-optics is Shaping the Future of Flat-panel, X-ray Detectors
XLV Diagnostics Inc., 290 Munro Street, Suite 2311, Thunder Bay, ON P7A 7T1
During the past twenty years, the physics of medical imaging has revolutionized the practice of radiography. Various direct and indirect conversion technologies have been translated into large area digital detectors whose ability to extract more accurate information from impinging x-ray quanta has contributed to improved clinical diagnostics. High precision and extremely low noise front end electronics has been required to acquire and process the detected information and to preserve its integrity. The byproduct of this approach has been a series of x-ray flat panel detectors with improved performance and high cost.
Today's health care economics necessitates a fresh look at the physics of medical imaging and its embodiment in x-ray detectors conducive to providing equivalent performance for substantially lower costs. Electro-optics applied on amorphous materials distinguishes itself from all other available technologies as the promising candidate to achieve the necessary cost - performance requirements of a novel generation of x-ray detectors.
The presentation will review the driving economic factors of large area detectors based on a-Se and will succinctly describe the cost reduction difficulties inherent in the structure of available detectors. It will provide a top level introduction into the physics of X-ray Light Valve (XLV) technology and will detail some important advantages for future generations of digital radiography machines based on x-ray detectors combining amorphous materials and electro-optics.
Keywords: X-ray Light Valve (XLV), a-Se, electro-optics, large area x-ray detectors, digital radiography